发明名称 Method for fabricating an inductor structure or a dual damascene structure
摘要 A method for fabricating an inductor structure or a dual damascene structure includes following steps. First, a dielectric layer is provided. Subsequently, a first etching process is performed on the dielectric layer so as to form a first opening in the dielectric layer. A polymer is also formed in the first opening during the first etching process. Next, a polymer-removing step is performed to remove the polymer. Thereafter, a second etching process is performed on the dielectric layer to form a second opening in the dielectric layer. Furthermore, the first opening and the second opening are filled with a conductive material so as to form an inductor structure or a dual damascene structure.
申请公布号 US7759244(B2) 申请公布日期 2010.07.20
申请号 US20070747214 申请日期 2007.05.10
申请人 UNITED MICROELECTRONICS CORP. 发明人 WANG JENG-HO
分类号 H01L21/4763;H01L21/311;H01L21/461 主分类号 H01L21/4763
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