发明名称 OXIDE SEMICONDUCTOR AND THIN FILM TRANSISTOR COMPRISING THE SAME
摘要 PURPOSE: An oxide semiconductor and a thin film transistor including the same are provided to improve the stability and the reliability of the oxide semiconductor by adding hafnium to an indium oxide. CONSTITUTION: An oxide layer(12) is formed on a substrate(11) by a thermal oxidation process. A gate electrode(13) is formed on the oxide layer. A gate insulating layer(14) is formed on the substrate and the gate electrode. A channel(15) is formed on the gate insulating layer by adding hafnium to an indium oxide. A source(16a) and a drain(16b) are formed on both sides of the channel and the insulating layer.
申请公布号 KR20100082576(A) 申请公布日期 2010.07.19
申请号 KR20090001942 申请日期 2009.01.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, SANG WOOK;PARK, SUNG HO;KIM, CHANG JUNG;KIM, SUN IL
分类号 H01L29/786;C09K13/04 主分类号 H01L29/786
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