发明名称 Immersion Fluid for Immersion Lithography, and Method of Performing Immersion Lithography
摘要 An immersion lithographic system 10 comprises an optical surface 51, an immersion fluid 60 with a pH less than 7 contacting at least a portion of the optical surface, and a semiconductor structure 80 having a topmost photoresist layer 70 wherein a portion of the photoresist is in contact with the immersion fluid. Further, a method for illuminating a semiconductor structure 80 having a topmost photoresist layer 70 comprising the steps of: introducing an immersion fluid 60 into a space between an optical surface 51 and the photoresist layer wherein the immersion fluid has a pH of less than 7, and directing light preferably with a wavelength of less than 450 nm through the immersion fluid and onto the photoresist.
申请公布号 US2010177289(A1) 申请公布日期 2010.07.15
申请号 US20100731752 申请日期 2010.03.25
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 YEO YEE-CHIA;LIN BURN-JENG;HU CHENMING
分类号 G03B27/52;G03F7/20 主分类号 G03B27/52
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