发明名称 HIGH FREQUENCY ANALYSIS OF A DEVICE UNDER TEST
摘要 Analyzing a device under test (“DUT”) at higher frequencies. A phase shifter varies the phase of a standing wave on a transmission line coupled to the DUT. The standing wave magnitude is sampled at each of the phase shifts and one or more DUT characteristics are determined as a function of the sampled magnitudes and phase shifts. Further aspects include a related phase shifter comprising a waveguide having a plurality of sub-resonant slots formed therein and having active elements for loading the slots to control the phase shift applied to the signal.
申请公布号 US2010176789(A1) 申请公布日期 2010.07.15
申请号 US20090354545 申请日期 2009.01.15
申请人 THE CURATORS OF THE UNIVERSITY OF MISSOURI 发明人 ZOUGHI REZA;ABOUKHOUSA MOHAMED AHMED;KHARKIVSKIY SERGIY
分类号 G01R29/00;H01P1/18 主分类号 G01R29/00
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