发明名称 MEMORY CELL ARRAY
摘要 PROBLEM TO BE SOLVED: To provide a memory cell array which is advantageous to miniaturization and is easy to design and manufacture. SOLUTION: A first bit line BL1 connected to a selected memory cell 100 is connected to a ground G, a word line WL connected to the memory cell 100 is specified, a writing voltage is supplied to a second bit line BL2, and data is written in the memory cell 100. The word line WL connected to the selected memory cell 100 is specified, a reading voltage lower than the writing voltage is supplied to the first bit line BL1 connected to the memory cell 100. Data is read out from the memory cell 100. In writing and reading, a voltage of the word line WL is set to a gate threshold voltage of a MOS transistor 110 or higher and a sum of a drive voltage of a circuit for specifying the first bit line BL1 and gate threshold voltage or lower to specify the word line WL. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010157568(A) 申请公布日期 2010.07.15
申请号 JP20080334129 申请日期 2008.12.26
申请人 FUNAI ELECTRIC ADVANCED APPLIED TECHNOLOGY RESEARCH INSTITUTE INC;FUNAI ELECTRIC CO LTD 发明人 TAKAHASHI TAKESHI;HAYASHI YUTAKA;MASUDA YUICHIRO;FURUTA SHIGEO;ONO MASATOSHI
分类号 H01L27/10;G11C13/00;H01L21/8242;H01L27/108 主分类号 H01L27/10
代理机构 代理人
主权项
地址