发明名称 MEMORY CELL ARRAY
摘要 PROBLEM TO BE SOLVED: To provide a memory cell array which is advantageous to miniturization and is easy to design and manufacture. SOLUTION: A first bit line BL1 connected to a selected memory cell 100 is connected to a ground G, a word line WL connected to the memory cell 100 is specified, a writing voltage is supplied to a second bit line BL2, and data is written in the memory cell 100. The first bit line BL1 connected to the selected memory cell 100 is connected to a sense amplifier, the word line WL connected to the memory cell 100 is specified, a reading voltage is supplied to the second bit line BL2, and data is read out from the memory cell 100. In writing and reading, a voltage of the word line WL is set to a gate threshold voltage of the MOS transistor 110 or higher and a sum of a drive voltage of a circuit for specifying the first bit line BL1 and a gate threshold voltage or lower to specify the word line WL. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010157569(A) 申请公布日期 2010.07.15
申请号 JP20080334144 申请日期 2008.12.26
申请人 FUNAI ELECTRIC ADVANCED APPLIED TECHNOLOGY RESEARCH INSTITUTE INC;FUNAI ELECTRIC CO LTD 发明人 TAKAHASHI TAKESHI;HAYASHI YUTAKA;MASUDA YUICHIRO;FURUTA SHIGEO;ONO MASATOSHI
分类号 H01L27/10;G11C13/00;H01L21/8242;H01L27/108 主分类号 H01L27/10
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