| 摘要 |
PROBLEM TO BE SOLVED: To provide an electronic component testing device capable of heightening a throughput of a handler by shortening a transfer time of an electronic component to be tested, and reducing troubles during transfer. SOLUTION: This device includes a plurality of test units on which test heads are mounted, a carrying-in/transfer unit for transferring the plurality of electronic components to be tested from a conveyance medium in the preceding process to test trays before being carried into the test units, and a carrying-out/transfer unit for carrying out the plurality of electronic components to be tested from the conveyance medium in the preceding process to a conveyance medium in the subsequent process. The carrying-in/transfer unit is provided on the forefront stage of the plurality of test units. The carrying-out/transfer unit is provided on the rearmost stage of the plurality of test units. The test tray further includes a middle transfer unit conveyed between each test unit or between each unit, for taking out a loaded electronic component to be tested out of the process during an interval between some test processes in the test unit, and loading another electronic component to be tested, or transferring it onto another test tray. COPYRIGHT: (C)2010,JPO&INPIT
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