发明名称 METHOD FOR MANUFACTURING CAPACITOR OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing capacitor of a semiconductor device is provided to suppress a die shot in an exposure process of forming a bottom electrode by forming a support layer in not only a cell region but also an outer wall of the cell region. CONSTITUTION: A first insulating layer is formed on a semiconductor substrate(300) including a cell region(3000a) and an edge area(3000b). A support layer(320) is formed on the insulating layer and the cell edge area. A second insulating layer is formed on the support layer. A hard mask layer is formed on the whole surface including the support layer. The hard mask layer, the support layer, and the first insulating layer are etched to form a bottom electrode(360).
申请公布号 KR20100081018(A) 申请公布日期 2010.07.14
申请号 KR20090000275 申请日期 2009.01.05
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUNG, YONG SOON
分类号 H01L27/108;H01L21/8242 主分类号 H01L27/108
代理机构 代理人
主权项
地址