发明名称 3-DIMENSIONAL SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A 3-dimensional semiconductor device is provide to reduce a leakage current of a selection transistor in programming by increasing the threshold voltage of the selection transistor. CONSTITUTION: A vertical channel pattern(165) is formed on a substrate(110). A plurality of cells gate patterns(143,145,147,149) and selection a gate pattern(132) are laminated on the substrate along the sidewall of the vertical channel pattern. A charge storage pattern is formed between the vertical channel pattern and cell gate pattern. Selection gate insulating layers(152,156) are formed between the vertical channel pattern and selection gate pattern.</p>
申请公布号 KR20100081113(A) 申请公布日期 2010.07.14
申请号 KR20090000396 申请日期 2009.01.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, JIN HO;HUR, SUNG HOI;KIM, HAN SOO;JANG, YOUNG GOAN;SHIM, SUN IN
分类号 H01L27/115;H01L21/768;H01L21/8247 主分类号 H01L27/115
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