发明名称 |
Measuring device for measuring aspects of objects |
摘要 |
An exemplary measuring device (100) for measuring aspects of objects includes a first contour measuring probe (10), a second contour measuring probe (20) and a processor (30). The first contour measuring probe (10) has a first tip extension (16) and a first displacement sensor (19). The first tip extension (16) is slidable in a first direction. The first displacement sensor (19) is used to sense a displacement of the first tip extension (16). The second contour measuring probe (20) has a second tip extension (26) and a second displacement sensor. The second tip extension (26) is slidable in the first direction. The second displacement sensor is used to sense a displacement of the second tip extension (26). The processor (30) is electrically connected to the first displacement sensor (19) and the second displacement sensor respectively.
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申请公布号 |
US7756673(B2) |
申请公布日期 |
2010.07.13 |
申请号 |
US20070966964 |
申请日期 |
2007.12.28 |
申请人 |
HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD.;HON HAI PRECISION INDUSTRY CO., LTD. |
发明人 |
LIU QING;LI JUN-QI |
分类号 |
G01B3/22 |
主分类号 |
G01B3/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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