发明名称 Method for mapping geometrical features with opto-electronic arrays
摘要 A method for inspecting a surface of an object, including scanning the surface using an array of opto-electronic sensors, obtaining a reflected light signal from a location on the surface, combining the light signals to form a representation of geometrical features of the surface, and processing the representation to obtain geometric quantities of the geometrical features. An apparatus for inspecting a well screen, including an array of a plurality of opto-electronic sensors, a motion control unit, and a processor for obtaining a geometric quantity of the well screen based on an image obtained by the sensor array and the location registered by the motion control unit.
申请公布号 US7755770(B2) 申请公布日期 2010.07.13
申请号 US20060308431 申请日期 2006.03.24
申请人 SCHLUMBERGER TECHNOLOGY CORPORATION 发明人 OHMER HERVE
分类号 G01B11/24 主分类号 G01B11/24
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