发明名称 Phase-change memory device with minimized reduction in thermal efficiency and method of manufacturing the same
摘要 A phase-change memory device has a different-material contact plug having a first electrically conductive material plug made of a first electrically conductive material, and a second electrically conductive material plug made of a second electrically conductive material having a specific resistance smaller than the first electrically conductive material, the first electrically conductive material plug and the second electrically conductive material plug being buried in a common contact hole. The different-material contact plug is effective for reducing the radiation of heat from a contact plug beneath a phase-change layer. The phase-change memory device also includes an extension electrode layer held in contact with a portion of the bottom surface of the phase-change layer in an area displaced off a position directly above a contact surface through which the phase-change layer and the heater electrode contact each other. The extension electrode layer reduces the radiation of heat from an electrode above the phase-change layer.
申请公布号 US7755075(B2) 申请公布日期 2010.07.13
申请号 US20070678484 申请日期 2007.02.23
申请人 ELPIDA MEMORY, INC. 发明人 HAYAKAWA TSUTOMU
分类号 H01L47/00 主分类号 H01L47/00
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