发明名称 |
Calibration circuit, semiconductor memory device including the same, and operating method of the calibration circuit |
摘要 |
Calibration circuit, semiconductor memory device including the same, and operation method of the calibration circuit includes a calibration unit configured to generate a calibration code for controlling a termination resistance value, a calibration control unit configured to count a clock and allow the calibration unit to be enabled during a predetermined clock and a clock control unit configured to selectively supply the clock to the calibration control unit according to an operation mode of a semiconductor device employing the calibration circuit.
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申请公布号 |
US7755383(B2) |
申请公布日期 |
2010.07.13 |
申请号 |
US20080165110 |
申请日期 |
2008.06.30 |
申请人 |
HYNIX SEMICONDUCTOR, INC. |
发明人 |
JEONG CHUN-SEOK;YOON SEOK-CHEOL |
分类号 |
H03K19/003 |
主分类号 |
H03K19/003 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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