发明名称 Calibration circuit, semiconductor memory device including the same, and operating method of the calibration circuit
摘要 Calibration circuit, semiconductor memory device including the same, and operation method of the calibration circuit includes a calibration unit configured to generate a calibration code for controlling a termination resistance value, a calibration control unit configured to count a clock and allow the calibration unit to be enabled during a predetermined clock and a clock control unit configured to selectively supply the clock to the calibration control unit according to an operation mode of a semiconductor device employing the calibration circuit.
申请公布号 US7755383(B2) 申请公布日期 2010.07.13
申请号 US20080165110 申请日期 2008.06.30
申请人 HYNIX SEMICONDUCTOR, INC. 发明人 JEONG CHUN-SEOK;YOON SEOK-CHEOL
分类号 H03K19/003 主分类号 H03K19/003
代理机构 代理人
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