| 摘要 |
PURPOSE: A circuit for measuring delay time is provided to effectively measure delay time of a standard cell of various integrated circuits by selectively using delay results of multiple standard cells. CONSTITUTION: A circuit for measuring delay time comprises a cell delay unit(10), a clock switch unit(20), and a measurement result generator(30). The cell delay unit comprises multiple standard cells and outputs first input clocks and second input clocks. The clock switch unit selects one of the first input clocks and outputs a control delay clock. And the clock switch unit selects one of the second input clocks and outputs a standard delay clock. The measurement result generator counts the standard delay clock and outputs the captured count result as an output signal. |
