| 摘要 |
An electromagnetic field distribution measurement apparatus (10) according to the present invention includes: an electromagnetic field probe (20) for measuring an electromagnetic field distribution; a scan apparatus (30) for scanning the vicinity of a wiring (120) with the electromagnetic field probe (20) ; and a data processing apparatus (50) for calculating the offset value (&Dgr;Xd) of the coordinate of the electromagnetic field probe (20) from the coordinate of the wiring (120). The data processing apparatus (50) extracts a characteristic point (E1 to E3) of the measured electromagnetic field distribution and calculates the offset value (&Dgr;Xd) based on the coordinates of the extracted characteristic point (E1 to E3).
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