发明名称 |
Verfahren zur Erkennung von defekten Elektroden in einer Mikroelektrodenmatrix |
摘要 |
<p>The method involves measuring an electrochemical impedance spectrum for electrodes (1). The spectrum is modeled by an implicit non-integral frequency model in the form of a parameter matrix. Principal components analysis of the matrix is performed for transforming the matrix into a final matrix with decorrelated variables. The distance between electrode and a reference point is calculated and compared with a preset threshold distance. The electrodes with distance greater than the threshold distance classified as defective.</p> |
申请公布号 |
DE602008001335(D1) |
申请公布日期 |
2010.07.08 |
申请号 |
DE20086001335T |
申请日期 |
2008.06.10 |
申请人 |
COMMISSARIAT A L'ENERGIE ATOMIQUE (CEA) |
发明人 |
CHIBANE, ALEXANDRE;GRANGEAT, PIERRE |
分类号 |
G01N27/403 |
主分类号 |
G01N27/403 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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