发明名称 SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD
摘要 PURPOSE: A substrate processing apparatus and a substrate processing method thereof are provided to improve the sensing efficiency of a substrate by changing or extending the optical path of an optical sensor which detects whether a substrate entered or whether the damage occurred. CONSTITUTION: A substrate(S) is accepted inside a chamber(100). An optical sensor(210) receives the lights on one side in which the substrate progresses. A first reflecting body(220) reflects the light in a position different from the optical sensor. A second reflecting body(230) reflects the light transmitting the substrate to the first reflecting body. The second reflecting body comprises a first reflecting mirror and a second reflecting mirror.
申请公布号 KR20100078525(A) 申请公布日期 2010.07.08
申请号 KR20080136810 申请日期 2008.12.30
申请人 LIGADP CO., LTD. 发明人 KIM, EUN SUK;HUR, SUNG JIN;LEE, SUNG YONG;PARK, SOON OK
分类号 H01L21/00 主分类号 H01L21/00
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