发明名称 |
SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD |
摘要 |
PURPOSE: A substrate processing apparatus and a substrate processing method thereof are provided to improve the sensing efficiency of a substrate by changing or extending the optical path of an optical sensor which detects whether a substrate entered or whether the damage occurred. CONSTITUTION: A substrate(S) is accepted inside a chamber(100). An optical sensor(210) receives the lights on one side in which the substrate progresses. A first reflecting body(220) reflects the light in a position different from the optical sensor. A second reflecting body(230) reflects the light transmitting the substrate to the first reflecting body. The second reflecting body comprises a first reflecting mirror and a second reflecting mirror.
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申请公布号 |
KR20100078525(A) |
申请公布日期 |
2010.07.08 |
申请号 |
KR20080136810 |
申请日期 |
2008.12.30 |
申请人 |
LIGADP CO., LTD. |
发明人 |
KIM, EUN SUK;HUR, SUNG JIN;LEE, SUNG YONG;PARK, SOON OK |
分类号 |
H01L21/00 |
主分类号 |
H01L21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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