发明名称 SEMICONDUCTOR DEVICE AND PROCESS OF FABRICATING THE SAME
摘要 PROBLEM TO BE SOLVED: To form a silicide layer stably on a gate electrode. SOLUTION: A memory cell 100 includes a silicon substrate 10, gate electrodes 12 and 13 arranged on the silicon substrate 10 while adjoining each other, an insulating layer 30 formed between the silicon substrate 10 and the gate electrode 12, and a charge storage layer 26 formed between the silicon substrate 10 and the gate electrode 12, wherein the gate electrode 12 becomes broad at least partially as it recedes from the silicon substrate 10. Since the gate electrode 12 is shaped to become broad at least partially as it recedes from the silicon substrate 10, the silicide layer 45 can be formed stably. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010153479(A) 申请公布日期 2010.07.08
申请号 JP20080327985 申请日期 2008.12.24
申请人 RENESAS ELECTRONICS CORP 发明人 IO EIJI
分类号 H01L21/8247;H01L21/28;H01L27/115;H01L29/423;H01L29/49;H01L29/788;H01L29/792 主分类号 H01L21/8247
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