发明名称 SYSTEM AND METHOD FOR METAL-OXIDE-SEMICONDUCTOR FIELD EFFECT TRANSISTOR
摘要 System and method for metal-oxide-semiconductor field effect transistor. In a specific embodiment, the invention provides a field effect transistor (FET), which includes a substrate material, the substrate material being characterized by a first conductivity type, the substrate material including a first portion, a second portion, and a third portion, the third portion being positioned between the first portion and the second portion. The FET also includes a source portion positioned within the first portion, the source portion being characterized by a second conductivity type, the second conductivity type being opposite of the first conductivity type. A first drain portion is positioned within second portion and characterized by the second conductivity type and a first doping concentration. A second drain portion is positioned within the second portion and is characterized by the second conductivity type and a second doping concentration, the second doping concentration being different from the first doping concentration.
申请公布号 US2010171186(A1) 申请公布日期 2010.07.08
申请号 US20090650494 申请日期 2009.12.30
申请人 SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION 发明人 XIAO DEYUAN
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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