发明名称 METHOD OF SILICON NITRIDE LINER IN STI STRUCTURE
摘要 PURPOSE: A silicon nitride liner formation method at STI structure is proceed the plasma processing [plasma treatment] and nitrogen ion doping process. The disappearance phenomenon of the silicon nitride liner is prevented. CONSTITUTION: A silicon nitride liner(102) is spread to the trench inside of the silicon substrate(100) formed for the forming field oxide film. The silicon nitride film liner surface is plasma processed. The nitrogen ion is to the silicon nitride film liner surface the doping. By using the gas in which the argon gas and helium gas are mixed, the plasma processing operates.
申请公布号 KR20100079149(A) 申请公布日期 2010.07.08
申请号 KR20080137564 申请日期 2008.12.30
申请人 DONGBU HITEK CO., LTD. 发明人 HWANG, JONG TAEK
分类号 H01L21/76 主分类号 H01L21/76
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