发明名称 |
SEMICONDUCTOR STRUCTURE, METHOD FOR FORMING SEMICONDUCTOR STRUCTURE, AND METHOD FOR OPERATING SEMICONDUCTOR DEVICE (SOI RADIO FREQUENCY SWITCH WITH ENHANCED SIGNAL FIDELITY AND ELECTRIC ISOLATION) |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor structure capable of performing signal isolation which is enhanced with respect to a semiconductor device from a bottom semiconductor layer in an SOI (Semiconductor On Insulator) substrate, a method for manufacturing the semiconductor structure, and a method for operating the semiconductor structure. SOLUTION: In a method for forming a semiconductor structure, a doped contact region 18 having an opposite conductivity type as a bottom semiconductor layer 10 is provided under a buried insulator layer 20 in the bottom semiconductor layer 10, and at least one conductive via structure 47 and 77 extends from an interconnect-level metal line 94 through a middle-of-line (MOL) dielectric layer 80, a shallow trench isolation structure 33 in a top semiconductor layer 30, and a buried insulator layer 20 to the doped contact region 18. COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2010153786(A) |
申请公布日期 |
2010.07.08 |
申请号 |
JP20090224423 |
申请日期 |
2009.09.29 |
申请人 |
INTERNATL BUSINESS MACH CORP |
发明人 |
SHI YUN;BOTULA ALAN BERNARD;JOSEPH ALVIN JOSE;SLINKMAN JAMES ALBERT;EDWARD J NOWAKU |
分类号 |
H01L29/786;H01L21/3205;H01L21/76;H01L21/762;H01L21/768;H01L21/822;H01L23/52;H01L27/04;H01L27/08 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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