发明名称 FLASH MEMORY DEVICE AND MANUFACTURING METHOD THE SAME
摘要 <p>PURPOSE: A flash memory device and manufacturing method thereof use the hot carrier injection mode in the program operation. The fast program speed is had. CONSTITUTION: A first memory gate(20a) and the second memory gate(20b) are formed on the substrate(10). The third oxide membrane is formed in the first, and the inner side and outer side surface of the second memory gate. Area-source is formed between the first memory gate and the second memory gate. The source poly contact(29) is formed between the first, and the second memory gate. The first and the second select gate are formed in the first, and the second memory gate outside.</p>
申请公布号 KR20100080190(A) 申请公布日期 2010.07.08
申请号 KR20080138836 申请日期 2008.12.31
申请人 DONGBU HITEK CO., LTD. 发明人 KWON, YOUNG JUN
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
代理机构 代理人
主权项
地址