MEMORY MODULE TESTER

摘要

PURPOSE: A memory module tester is provided to test a memory module with high-speed using a mounting test method and a JTAG protocol. CONSTITUTION: A memory module tester comprises a buffer, an interface unit(150), and a gate array unit(140). The bust corresponds to a memory module. The memory module has an engine for a self-test. A test program for a memory module test is input to the interface unit. The gate array unit transfers the test program to the buffer through a JTAG protocol and reads a test result stored in the buffer.