发明名称 METHOD OF MANUFACTURING PHOTOMASK BLANK AND METHOD OF MANUFACTURING PHOTOMASK
摘要 <p>PURPOSE: A method for manufacturing a photomask blank and a method for manufacturing a photomask are provided to improve the resistance of a thin film to exposed light having a wavelength less than 200nm and to improve the lifespan of the mask. CONSTITUTION: A method for manufacturing a photomask blank comprises the following steps: forming a thin film containing metal and silica on a transparent substrate(1); and modifying the main surface of the thin film in advance to maintain the transcription property of a thin film pattern when light, having a wavelength less than 200nm, is irradiated on the thin film pattern of the photomask. A layer containing silica and oxygen is formed on the superficial layer of the thin film.</p>
申请公布号 KR20100080413(A) 申请公布日期 2010.07.08
申请号 KR20090131609 申请日期 2009.12.28
申请人 HOYA CORPORATION 发明人 SUZUKI TOSHIYUKI;HASHIMOTO MASAHIRO;ONO KAZUNORI;OHKUBO RYO;SAKAI KAZUYA
分类号 G03F1/50;G03F1/54;H01L21/027 主分类号 G03F1/50
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