发明名称 |
METHOD OF MANUFACTURING PHOTOMASK BLANK AND METHOD OF MANUFACTURING PHOTOMASK |
摘要 |
<p>PURPOSE: A method for manufacturing a photomask blank and a method for manufacturing a photomask are provided to improve the resistance of a thin film to exposed light having a wavelength less than 200nm and to improve the lifespan of the mask. CONSTITUTION: A method for manufacturing a photomask blank comprises the following steps: forming a thin film containing metal and silica on a transparent substrate(1); and modifying the main surface of the thin film in advance to maintain the transcription property of a thin film pattern when light, having a wavelength less than 200nm, is irradiated on the thin film pattern of the photomask. A layer containing silica and oxygen is formed on the superficial layer of the thin film.</p> |
申请公布号 |
KR20100080413(A) |
申请公布日期 |
2010.07.08 |
申请号 |
KR20090131609 |
申请日期 |
2009.12.28 |
申请人 |
HOYA CORPORATION |
发明人 |
SUZUKI TOSHIYUKI;HASHIMOTO MASAHIRO;ONO KAZUNORI;OHKUBO RYO;SAKAI KAZUYA |
分类号 |
G03F1/50;G03F1/54;H01L21/027 |
主分类号 |
G03F1/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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