发明名称 |
SINGLE ELECTRON TRANSISTOR USING MOS BARRIER AND FABRICATION METHOD OF THE SAME |
摘要 |
<p>PURPOSE: A single electron transistor and the manufacturing method thereof using the MOS obstacle use the MOS obstacle as the tunneling barrier. The interface trap and Fermi level pinning phenomenon are prevented. CONSTITUTION: A quantum dot(24) which is to the silicon is formed on the substrate(10). The front side of the quantum dot is surrounded by the insulating layer(32). It leaves the insulating layer in interval and the source and drain are formed. While leaving the insulating layer in interval and protecting the quantum dot, the gate is formed. The silicon forming quantum dot the SOI(Silicon On Insulator).</p> |
申请公布号 |
KR20100080023(A) |
申请公布日期 |
2010.07.08 |
申请号 |
KR20080138639 |
申请日期 |
2008.12.31 |
申请人 |
SNU R&DB FOUNDATION |
发明人 |
PARK, BYUNG GOOK;LEE, JUNG HAN |
分类号 |
H01L29/78;H01L21/336;H01L29/775 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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