发明名称 HETERODYNE BEAT PROBE SCANNING PROBE TUNNEL MICROSCOPE AND METHOD OF MEASURING MICRO SIGNAL SUPERIMPOSED THEREBY ON TUNNEL CURRENT
摘要 <P>PROBLEM TO BE SOLVED: To provide a heterodyne beat probe scanning probe tunnel microscope capable of easily and unfailingly detecting a weak RF signal, and a method of specifying a heterodyne beat signal by the scanning probe tunnel microscope. Ž<P>SOLUTION: The scanning probe tunnel microscope includes a scanning tunnel microscope analyzing section for superimposing a given known externally superimposed reference high-frequency signal or externally superimposed reference electromagnetic signal on an unknown high-frequency signal or electromagnetic signal and causing quantum interference, wherein the externally superimposed reference high-frequency signal or externally superimposed reference electromagnetic signal is gradually approximated to the unknown high-frequency signal or the electromagnetic signal and is subjected to frequency sweeping to cause quantum interference, a tunnel current modulated by generating a heterodyne beat signal is generated from the quantum interference, and the unknown high-frequency signal or electromagnetic signal is detected. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010151839(A) 申请公布日期 2010.07.08
申请号 JP20100066164 申请日期 2010.03.23
申请人 UNIV OF TSUKUBA 发明人 MATSUYAMA EIJI;SHIGEKAWA HIDEMI;NEMOTO SHOJIRO;NAKAMURA JUNJI;OIGAWA HARUHIRO;TAKEUCHI OSAMU;YASUDA SATOSHI
分类号 G01Q30/02;G01Q60/52 主分类号 G01Q30/02
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