| 摘要 |
<P>PROBLEM TO BE SOLVED: To solve the following problem: a voltage value at which a leakage current is minimized and a voltage value at which data holding can be guaranteed vary with a finish of a chip, temperature etc., with respect to power supply control technique and substrate control technique for reducing leakage electric power. Ž<P>SOLUTION: The semiconductor integrated circuit device includes a circuit body (1) which requires a data holding state, a data holding characteristic evaluation circuit (3) configured to measure the data holding state of the circuit body (1), a leakage current evaluation circuit (2) configured to measure a leakage current of the circuit body (1), a voltage control signal generation circuit (5) configured to control a voltage supply circuit (6) of the circuit body (1), and a storage circuit (4) configured to store measurement results of the leakage current evaluation circuit (2) and data holding characteristic evaluation circuit (3). Based upon storage data in the storage circuit (4), the voltage control signal generation circuit (5) sets a voltage at which the leakage current of the circuit body (1) becomes minimum for the voltage supply circuit (6). Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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