发明名称 METHOD AND DEVICE FOR ANALYZING PARTICLE IMAGE
摘要 PROBLEM TO BE SOLVED: To achieve a method of analyzing particle images capable of performing highly reliable review support by extracting an image similar to an image which an operator has a difficulty in judgment from registered reference images for display. SOLUTION: The operator selects the image by a mouse, or the like and selects candidate image display of sub-menus (Steps 301, 302). Candidate images are narrowed down based on reference image feature parameters stored in a reference image memory, and only images satisfying size parameters are extracted (Step 303). Then, parameters of form information and color information are extracted from selection images, and are compared with extracted images to determine the presence or absence of candidate images (Steps 304, 305). When a criterion is met, candidate image display is performed (Step 307). Conversely, when no candidate images satisfying the criterion can be extracted, a message is displayed (Step 306). COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010151523(A) 申请公布日期 2010.07.08
申请号 JP20080328028 申请日期 2008.12.24
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 TAKI MIKI;OWADA HAKUO
分类号 G01N15/14;G01N21/17 主分类号 G01N15/14
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