发明名称 EXTENDED LINER FOR LOCALIZED THICK COPPER INTERCONNECT
摘要 A dielectric layer overlies a semiconductor substrate. The substrate has components and appropriate contacts formed therein. The dielectric layer electrically insulates the substrate and components from overlying conductive interconnect layers. A barrier layer is arranged over the dielectric layer to isolate the interconnect layers from other structures. A copper layer is then deposited over the barrier layer and thick interconnect lines having a first width and a first height are realized. Then, the barrier layer is etched using one of many alternative techniques. The barrier layer has a second width and a second height wherein the second width of the barrier liner is selected to be greater than the first width of the thick copper interconnect.
申请公布号 US2010171219(A1) 申请公布日期 2010.07.08
申请号 US20090650805 申请日期 2009.12.31
申请人 STMICROELECTRONICS, INC. 发明人 MOREAU DAVID;CIAVATTI JEROME
分类号 H01L23/522;H01L21/768 主分类号 H01L23/522
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