| 摘要 |
PURPOSE: A test circuit for a semiconductor memory apparatus is provided to generate a self refresh pulse signal during a self refresh mode end section, thereby easily detecting a self refresh detect. CONSTITUTION: A test pulse generating unit(100) outputs a self refresh test signal. The first pulse generating unit(200) outputs a self refresh pulse signal in response to a self refresh test signal and an oscillator signal. The second pulse generating unit(300) generates an inner self refresh. A test pulse generating unit comprises the first logic device, a pulse generating unit, and an outputting device. |
