发明名称 INTERNAL VOLTAGE GENERATING CIRCUIT FOR SEMICONDUCTOR MEMORY APPARATUS
摘要 PURPOSE: An internal voltage generating circuit for a semiconductor memory apparatus is provided to reduce a manufacturing period by allowing a user to easily find out a cause of malfunction of a driver. CONSTITUTION: A reset(100) drives an internal voltage generation circuit. The reset comprises a comparator(110), a drive controller(120), and an output driver(130). The comparator outputs a comparison signal according to a reference voltage level. The drive controller outputs a driving signal in response to the comparison signal and test mode signal. The output driver receives the driving signal and outputs the rest signal.
申请公布号 KR20100078199(A) 申请公布日期 2010.07.08
申请号 KR20080136386 申请日期 2008.12.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KO, YOUNG JO
分类号 G11C5/14;G11C7/20;G11C29/00 主分类号 G11C5/14
代理机构 代理人
主权项
地址