发明名称 METHOD OF FORMING PATTERNS OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A pattern formation method of the semiconductor device prevents the formation of the unnecessary pattern in the top of the substrate. The effective area of the top of the substrate is utilized efficiently. CONSTITUTION: A blood etch layer(310) is formed on the substrate(300) including the first area and the second part. A plurality of first carbon containing film patterns is formed on the blood etch layer. A buffer layer(350) covering the upper side and side wall of a plurality of first carbon containing film patterns is formed. The second carbon containing film is formed on the buffer layer. The second carbon containing film is eliminated and the buffer layer exposes.
申请公布号 KR20100079947(A) 申请公布日期 2010.07.08
申请号 KR20080138548 申请日期 2008.12.31
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YOON, DONG KI;YI, SHI YONG;CHOI, SEONG WOON;OH, SEOK HWAN;YOON, KWANG SUB;KIM, MYEONG CHEOL;PARK, YOUNG JU
分类号 H01L21/027 主分类号 H01L21/027
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