发明名称 PICK-AND-PLACE APPARATUS OF TEST HANDLER
摘要 PURPOSE: A pick and place system of a test handler is provided to control interval between the line spacing and heat of the pickers by using the device for controlling the width between the line spacing device for controlling the width and heat. CONSTITUTION: A Picker(320) is arranged as the NXM array form. A line spacing device for controlling the width(330) guides the column direction movement of pickers. The line spacing device for controlling the width controls the line spacing interval of pickers. A device for controlling the width(340) guides the line writing direction movement of pickers between the heat. The device for controlling the width controls interval between the heat between the heat of pickers. The line spacing device for controlling the width comprises a plurality of column direction guide members(331), and the driving source(335) for a cam member(332) for the line spacing gaping and line spacing gaping. The device for controlling the width between the heat comprises a plurality of line writing direction guide members(341), and the driving source(345) for gaping between the cam member(342) for gaping between the heat and the heat.
申请公布号 KR20100079945(A) 申请公布日期 2010.07.08
申请号 KR20080138546 申请日期 2008.12.31
申请人 TECHWING CO., LTD. 发明人 PARK, YOUNG DEA
分类号 G01R31/26;H01L21/66;H01L21/67 主分类号 G01R31/26
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