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发明名称
Non-destructive inspection system having self-aligning probe assembly
摘要
申请公布号
GB201008667(D0)
申请公布日期
2010.07.07
申请号
GB20100008667
申请日期
2010.05.25
申请人
GENERAL ELECTRIC COMPANY
发明人
分类号
主分类号
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代理人
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