| 摘要 |
An interface member (52) which is provided between the main body of a test head used in an electronic component testing device and a socket board (51) including a socket (512) to which an IC device (2) under test is attached and a plurality of socket-side connectors (514) electrically connected to the socket (512) and which electrically connects the main body of the test head and the socket board (51). The interface member (52) comprises IF-side connectors (524) engaged with the socket-side connectors (514), an upper frame (521) supporting the IF-side connectors (524), and a box-shaped lower frame (522) provided thereunder. Holes (521h) through which the IF-side connectors (524) penetrate are formed in the upper frame (521) and heat insulators (525) are provided between the IF-side connectors (524) penetrating through the holes (521h). Additionally, a plurality of block-shaped heat insulators (526) through which cables (524c) of the IF-side connectors (524) pass are spread all over the inside of the box-shaped lower frame (522).
|
