发明名称 Metal-substituted transistor gates
摘要 One aspect of this disclosure relates to an integrated circuit structure. An integrated circuit structure embodiment includes a substrate, a gate dielectric over the substrate, a carbon structure having a predetermined thickness in contact with and over the gate dielectric, and a layer of desired gate material for a transistor in contact with and over the carbon structure. The layer of desired gate material includes a predetermined thickness corresponding to the predetermined thickness of the carbon structure to support a metal substitution process to replace the carbon structure with the desired gate material. Other aspects and embodiments are provided herein.
申请公布号 US7750379(B2) 申请公布日期 2010.07.06
申请号 US20060445000 申请日期 2006.06.01
申请人 MICRON TECHNOLOGY, INC. 发明人 FORBES LEONARD;FARRAR PAUL A.;AHN KIE Y.
分类号 H01L29/772 主分类号 H01L29/772
代理机构 代理人
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