| 摘要 |
PURPOSE: A semiconductor device is provided to implement a selective test without increase of the number of lines between a test device and the plurality of semiconductor devices by testing a semiconductor device selected in correspondence with the number of pulsing of a test signal. CONSTITUTION: Test device selection signal generators(310, 410) generates a plurality of test device selection signals. The plurality of test device selection signals are selectively activated according to the number of pulsing of the test signal. The test signal is controlled with by a test equipment(200). Test mode signal generating units(320, 420) generates a plurality of test mode signals. |
