发明名称 METHOD FOR CLEANING PHOTOMASK
摘要 <p>PURPOSE: A photomask cleaning method is provided to efficiently eliminate the hardening adhesive foreign material attached on the photomask by using the vibration force of a nano particle dispersed in the ultra-pure water. CONSTITUTION: A cleaning bath(100) is prepared for implementation of the washing of the photomask. A predetermined mask pattern(210) is formed on a transparent substrate(200) of the photomask. Photomask is submerged into the ultra-pure water(120) including a particle(110). The foreign material(220) attached on the photomask is removed by vibrating the nano particle.</p>
申请公布号 KR20100076700(A) 申请公布日期 2010.07.06
申请号 KR20080134828 申请日期 2008.12.26
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, DONG WOOK
分类号 H01L21/027 主分类号 H01L21/027
代理机构 代理人
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