发明名称 METHOD FOR FORMING PATTERN OF A SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A pattern formation method of a semiconductor device is provided to prevent the size of a semiconductor device from increasing by stably forming multiple patterns which are separated from each other. CONSTITUTION: An etching object film is formed on a semiconductor substrate(101). Multiple first photo resist patterns are formed on the etching object film at first intervals. Multiple etch patterns(114) are formed by etching an etching object film using a mask First photo resist patterns are removed. A second photoresist pattern(117) exposing etch patterns included in the second group is formed.</p>
申请公布号 KR20100076317(A) 申请公布日期 2010.07.06
申请号 KR20080134328 申请日期 2008.12.26
申请人 HYNIX SEMICONDUCTOR INC. 发明人 ROH, CHI HYEONG
分类号 H01L21/027;H01L21/8247 主分类号 H01L21/027
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