发明名称 PHASE CHANGE RANDOMM ACCESS MEMORY DEVICE AND MANUFACTURING METHOD THEREOF
摘要 <p>PURPOSE: A phase change memory device and a manufacturing method thereof are provided to reduce void between phase change pattern layers by forming a capping layer in the state a dielectric layer has been filled between the phase change pattern layers. CONSTITUTION: A plurality of phase change pattern layers(165) are formed on a semiconductor substrate(100). A first interlayer dielectric layer(110) is filled between the phase change pattern layers. A capping layer(190) is formed on the phase change pattern layers and the first interlayer dielectric layer. The phase change pattern layers are formed in a row in a memory cell line. A upper electrode(210) connected to the phase change pattern layers is further comprised.</p>
申请公布号 KR20100076631(A) 申请公布日期 2010.07.06
申请号 KR20080134745 申请日期 2008.12.26
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KUM, KYONG SOO;KWON, KI SUNG
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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