发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A manufacturing method of a semiconductor device is provided to prevent a seam generated on a conductive material for a contact plug from increasing by omitting a planarization process and forming a conductive material for a top metal line after forming a conductive material for a contact plug. CONSTITUTION: Inter-layer insulating films(102,106) are formed on a semiconductor substrate(100). A contact hole is formed in the inter-layer insulating film. The first conductive film is formed on the inside of the contact hole and the top of the inter-layer insulating film. The second conductive film is formed on the top of the first conductive film. The second conductive film and the first conductive film are patterned so that a top metal line(104) and a contact plug are simultaneously formed.
申请公布号 KR20100076318(A) 申请公布日期 2010.07.06
申请号 KR20080134329 申请日期 2008.12.26
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JEONG, CHEOL MO;KIM, EUN SOO;LIM, JUNG YEON
分类号 H01L21/28;H01L21/3205 主分类号 H01L21/28
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