发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A manufacturing method of a semiconductor device is provided to prevent a seam generated on a conductive material for a contact plug from increasing by omitting a planarization process and forming a conductive material for a top metal line after forming a conductive material for a contact plug. CONSTITUTION: Inter-layer insulating films(102,106) are formed on a semiconductor substrate(100). A contact hole is formed in the inter-layer insulating film. The first conductive film is formed on the inside of the contact hole and the top of the inter-layer insulating film. The second conductive film is formed on the top of the first conductive film. The second conductive film and the first conductive film are patterned so that a top metal line(104) and a contact plug are simultaneously formed.
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申请公布号 |
KR20100076318(A) |
申请公布日期 |
2010.07.06 |
申请号 |
KR20080134329 |
申请日期 |
2008.12.26 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
JEONG, CHEOL MO;KIM, EUN SOO;LIM, JUNG YEON |
分类号 |
H01L21/28;H01L21/3205 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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