发明名称 CIRCUIT AND METHOD FOR MEASURING CAPACITANCE OF CAPACITOR
摘要 PURPOSE: A circuit and a method for measuring the capacitance of a capacitor are provided to measure accurate capacitance and AC characteristics of a capacitor. CONSTITUTION: A pulse generator(100) outputs a pulse signal. A delay unit(200) comprises a capacitor and outputs a delay signal by delaying the pulse signal through the capacitor. A comparator(250) receives the pulse signal and the delay signal and outputs a comparison signal based on the phase difference between the signals.
申请公布号 KR20100076630(A) 申请公布日期 2010.07.06
申请号 KR20080134744 申请日期 2008.12.26
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KWON, YONG KEE;LEE, HYUNG DONG
分类号 G01R27/26 主分类号 G01R27/26
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