发明名称 |
CIRCUIT AND METHOD FOR MEASURING CAPACITANCE OF CAPACITOR |
摘要 |
PURPOSE: A circuit and a method for measuring the capacitance of a capacitor are provided to measure accurate capacitance and AC characteristics of a capacitor. CONSTITUTION: A pulse generator(100) outputs a pulse signal. A delay unit(200) comprises a capacitor and outputs a delay signal by delaying the pulse signal through the capacitor. A comparator(250) receives the pulse signal and the delay signal and outputs a comparison signal based on the phase difference between the signals. |
申请公布号 |
KR20100076630(A) |
申请公布日期 |
2010.07.06 |
申请号 |
KR20080134744 |
申请日期 |
2008.12.26 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KWON, YONG KEE;LEE, HYUNG DONG |
分类号 |
G01R27/26 |
主分类号 |
G01R27/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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