发明名称 |
Method for control of the thickness of extruded film |
摘要 |
A process for the automatic control of the thickness of extruded film lowers the deviations in the thickness of the film more quickly after the start of the extrusion process. The process includes the measurement of the thickness profile of the film just extruded by means of a thickness-measuring probe. The thickness-measuring probe is moved along the surface of the film substantially perpendicular to the conveying direction of the extruded film. The thickness-measuring probe records a thickness profile of the film for each measuring cycle at least over parts of the expansion of the film perpendicular to its conveying direction. While providing statistical values in relation to older measured values, the latest measured values during a predetermined time-frame at the start of the extrusion process are more heavily weighted by a computer than those measured during the normal operation.
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申请公布号 |
US7751923(B2) |
申请公布日期 |
2010.07.06 |
申请号 |
US20030541355 |
申请日期 |
2003.12.09 |
申请人 |
WINDMOELLER & HOELSCHER KG |
发明人 |
KOENIG LOTHAR;TROMMELEN BARTHOLOMEUS |
分类号 |
B29C39/00;B29C45/76;B29C47/16;B29C47/92 |
主分类号 |
B29C39/00 |
代理机构 |
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地址 |
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