发明名称 METAL LAYER DEPOSITION APPARATUS OF SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A metal layer deposition apparatus of a semiconductor is provided to implement the EBR(Edge Bevel Removal) process normally by determining the status of normal position of a wafer edge area or the status of etching of the wafer edge area. CONSTITUTION: A semiconductor wafer inserted into a chamber(100) is loaded on a fixing pin(120). A pedestal(110) rotates the wafer. An etching nozzle(130) is located on the upper part of the pedestal. The etching nozzle eliminates the metal layer of the edge area by spraying the etching member. A sensor(160) senses the presence of the metal layer.</p>
申请公布号 KR20100076712(A) 申请公布日期 2010.07.06
申请号 KR20080134844 申请日期 2008.12.26
申请人 DONGBU HITEK CO., LTD. 发明人 KIM, HONG KYU
分类号 H01L21/302;H01L21/027;H01L21/283 主分类号 H01L21/302
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