发明名称 METHOD FOR FORMING SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A formation method of a semiconductor device is provided to improve definition quadruply using a spacer patterning technique. CONSTITUTION: A photosensitive pattern is formed at the upper part of a semiconductor substrate(100) in which an etched layer(102) is formed. A first spacer(106) is formed on the sidewall of the photosensitive pattern. A second spacer is formed on the sidewall of the first spacer. A third spacer(110) is formed on the sidewall of the second spacer. The photosensitive pattern and the second spacer are removed. A final pattern is formed by using a first spacer and a second spacer as an etching mask and etching the etched layer.</p>
申请公布号 KR20100076470(A) 申请公布日期 2010.07.06
申请号 KR20080134532 申请日期 2008.12.26
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JANG, JONG WON;KO, SUNG WOO
分类号 H01L21/027 主分类号 H01L21/027
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