发明名称 |
METHOD FOR FORMING SEMICONDUCTOR DEVICE |
摘要 |
<p>PURPOSE: A formation method of a semiconductor device is provided to improve definition quadruply using a spacer patterning technique. CONSTITUTION: A photosensitive pattern is formed at the upper part of a semiconductor substrate(100) in which an etched layer(102) is formed. A first spacer(106) is formed on the sidewall of the photosensitive pattern. A second spacer is formed on the sidewall of the first spacer. A third spacer(110) is formed on the sidewall of the second spacer. The photosensitive pattern and the second spacer are removed. A final pattern is formed by using a first spacer and a second spacer as an etching mask and etching the etched layer.</p> |
申请公布号 |
KR20100076470(A) |
申请公布日期 |
2010.07.06 |
申请号 |
KR20080134532 |
申请日期 |
2008.12.26 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
JANG, JONG WON;KO, SUNG WOO |
分类号 |
H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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