发明名称 |
METHOD OF MANUFACTURING NON-VOLATILE MEMORY DEVICE |
摘要 |
<p>PURPOSE: A manufacturing method of a non-volatile memory device is provided to prevent the threshold voltage reduction of a non-volatile memory device by protecting a dielectric layer through a protective film when a void is generated. CONSTITUTION: An element isolation film(208) and a floating gate are formed on a semiconductor substrate(200). A dielectric film(210) is formed along the surface of the floating gate and the element isolation film. A protective film(212) is formed along the surface of the dielectric film. A control gate is formed on the top of the protective film. The protective film is formed of the same material as the control gate.</p> |
申请公布号 |
KR20100076320(A) |
申请公布日期 |
2010.07.06 |
申请号 |
KR20080134331 |
申请日期 |
2008.12.26 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHO, JUNG IL;SUH, WEON JOON |
分类号 |
H01L21/8247;H01L27/115 |
主分类号 |
H01L21/8247 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|