发明名称 METHOD OF MANUFACTURING NON-VOLATILE MEMORY DEVICE
摘要 <p>PURPOSE: A manufacturing method of a non-volatile memory device is provided to prevent the threshold voltage reduction of a non-volatile memory device by protecting a dielectric layer through a protective film when a void is generated. CONSTITUTION: An element isolation film(208) and a floating gate are formed on a semiconductor substrate(200). A dielectric film(210) is formed along the surface of the floating gate and the element isolation film. A protective film(212) is formed along the surface of the dielectric film. A control gate is formed on the top of the protective film. The protective film is formed of the same material as the control gate.</p>
申请公布号 KR20100076320(A) 申请公布日期 2010.07.06
申请号 KR20080134331 申请日期 2008.12.26
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHO, JUNG IL;SUH, WEON JOON
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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