发明名称 METHOD OF MANUFACTURING PHASE SHIFT MASK
摘要 <p>PURPOSE: A manufacturing method of a phase shift mask is provided to improve the degree of integration of a semiconductor device by facilitating a micro patterning process of the semiconductor device. CONSTITUTION: A manufacturing method of a phase shift mask comprises the following steps: forming a light-shielding layer and a phase shift layer on a quartz substrate(100); pattering the light-shielding layer and the phase shift layer for forming a phase shift pattern(102a) and a light-shielding pattern(104a); and reducing the thickness of the light-shielding pattern. The phase shift layer is formed with a SOG(spin on glass) layer or a SiO_2 film. The light-shielding layer is formed with a film including chrome.</p>
申请公布号 KR20100076309(A) 申请公布日期 2010.07.06
申请号 KR20080134320 申请日期 2008.12.26
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, DAE WOO
分类号 G03F1/26;H01L21/027 主分类号 G03F1/26
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