发明名称 |
GST FOR FORMING AND PCRAM OF MAUFACTURING USING THEREOF |
摘要 |
<p>PURPOSE: A method for forming a phase change film and a method for manufacturing a phase change memory device using the same are provided to improve a burying property of a phase change film by forming the phase change film with an etching process of low power not to change the material property of the phase change film. CONSTITUTION: A bottom electrode is formed. An interlayer insulation layer with a hole is formed on the bottom electrode. A phase change film(240) is formed to fill the hole. A top electrode is formed on the upper side of the phase change film. The phase change film is formed by repeating a first deposition process, an etching process, and a second deposition process 1 to 10 times. The etching process of the phase change film is an RF etching process.</p> |
申请公布号 |
KR20100075273(A) |
申请公布日期 |
2010.07.02 |
申请号 |
KR20080133921 |
申请日期 |
2008.12.24 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, HYUN PHILL;RHO, IL CHEOL;CHUNG, JIE WON |
分类号 |
H01L27/115;H01L21/20 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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