发明名称 |
MANUFACTURING METHOD OF GATE PATTERNS FOR FLASH MEMORY DEVICE |
摘要 |
<p>PURPOSE: A method for manufacturing gate patterns for a flash memory device is provided to improve the interfacial property of a poly-silicon layer by improving the surface uniformity of the poly-silicon layer. CONSTITUTION: A tunnel insulating layer(103) is formed on a semiconductor substrate(101). An amorphous silicon layer is deposited on the upper side of the tunnel insulating layer. An annealing operation is performed under a vacuum condition in a chamber for depositing the amorphous silicon layer in order to form a grain and simultaneously eliminate exhaust gas inside the amorphous silicon layer.</p> |
申请公布号 |
KR20100074679(A) |
申请公布日期 |
2010.07.02 |
申请号 |
KR20080133170 |
申请日期 |
2008.12.24 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHANG, JUNG YUN;JANG, MIN SIK;SHON, HYUN SOO;KIM, HEE SOO |
分类号 |
H01L21/8247;H01L27/115 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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