发明名称 MANUFACTURING METHOD OF GATE PATTERNS FOR FLASH MEMORY DEVICE
摘要 <p>PURPOSE: A method for manufacturing gate patterns for a flash memory device is provided to improve the interfacial property of a poly-silicon layer by improving the surface uniformity of the poly-silicon layer. CONSTITUTION: A tunnel insulating layer(103) is formed on a semiconductor substrate(101). An amorphous silicon layer is deposited on the upper side of the tunnel insulating layer. An annealing operation is performed under a vacuum condition in a chamber for depositing the amorphous silicon layer in order to form a grain and simultaneously eliminate exhaust gas inside the amorphous silicon layer.</p>
申请公布号 KR20100074679(A) 申请公布日期 2010.07.02
申请号 KR20080133170 申请日期 2008.12.24
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHANG, JUNG YUN;JANG, MIN SIK;SHON, HYUN SOO;KIM, HEE SOO
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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