BURN-IN TEST CIRCUIT AND METHOD

摘要

PURPOSE: A burn-in test circuit and a method thereof are provided to prevent degradation of a transistor although high burn-in voltage is applied to during a burn-in test. CONSTITUTION: A burn-in test mode input signal is activated. An electric potential difference control part(20) outputs a voltage. A voltage has a higher level than a ground voltage. A driving signal output part(10) outputs a burn-in voltage or the output voltage of the electric potential difference control part according to the driving signal. The electric potential difference control part outputs a core voltage.